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QE-001
分光效率量測系統
分光效率量測系統
| Standard | ASTM E1021 and IEC 60904-8 |
| Function | external quantum efficiency measurement |
| Wavelength | 400-800nm, 350-1050nm, 300-1500nm |
| Light Source |
Xenon Lamp (UV-VIS) Tungsten halogen lamp(VIS-NIR) |
| Irradiance monitor |
Calibrated reference photodiode InGaAs sensor |
| Sample Size |
2cm square or 0.5cm diameter |
| Reflectance measurement system is needed for internal quantum efficiency | |
